• DocumentCode
    1494501
  • Title

    Theory of refractive index variation in quantum well structure and related intersectional optical switch

  • Author

    Yamamoto, Hiroaki ; Asada, Masahiro ; Suematsu, Yasuharu

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
  • Volume
    6
  • Issue
    12
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    1831
  • Lastpage
    1840
  • Abstract
    Attention is focused on the deformation of electron wave functions due to an applied field in a quantum well (QW) neglecting the exciton effect. Compared to the electrooptic effect of bulk semiconductor, the theoretical refractive index variation in a QW structure due to this phenomenon is considerably larger at the wavelength corresponding to the energy gap between the first quantized energy levels in the conduction and valence bands. Since the absorption loss changes by the same mechanism, the appropriate wavelength region is estimated for larger index variation where the absorption loss is relatively smaller. The design of a related intersectional optical switch of a small size is discussed. A switch with a length of about 10 μm is achievable with an intersectional angle of more than 10° at a waveguide width of 1 μm. This optical switch is expected to be of high speed and is integrable monolithically with lasers
  • Keywords
    conduction bands; energy gap; optical switches; refractive index; semiconductors; valence bands; 1.0 micron; 10 micron; QW; absorption loss; bulk semiconductor; conduction band; electron wave functions; electrooptic effect; energy gap; exciton effect; monolithic integration; quantized energy levels; quantum well structure; refractive index; related intersectional optical switch; valence bands; wavefunction deformation; Absorption; Electrons; Electrooptic effects; Excitons; Optical losses; Optical switches; Optical waveguides; Quantum mechanics; Refractive index; Wave functions;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.9252
  • Filename
    9252