DocumentCode :
1494599
Title :
Processing of thick-film dielectrics compatible with thin-film superconductors for analog signal processing devices
Author :
Wong, S.C. ; Anderson, A.C. ; Rudman, D.A.
Author_Institution :
MIT, Lincoln Lab., Lexington, MA, USA
Volume :
25
Issue :
2
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
1255
Lastpage :
1257
Abstract :
The authors demonstrate the feasibility of integrating thick-film dielectrics with thin-film superconductors in the fabrication of signal processing devices. Thin films of Nb and NbN are deposited by RF sputtering and patterned photolithographically. Thick film dielectrics can be spun on to a controlled thickness of 10 to 25 μm, which is an optimum range for high-density, low-loss microwave delay lines. After an organic-binder burnout step at 450°C in air, the ceramic dielectrics are sintered onto the NbN thin films at 850°C in vacuum. The transition temperature of the NbN changes from 15 K as sputtered to 9 K after sintering, but superconductivity is preserved by the presence of thin-film MgO and SiO2 barrier layers. Lumped-element resonators, in which the inductor and the capacitor electrodes are made of NbN and the dielectric of thick-film ceramic, have been successfully fabricated for measuring the dielectric properties of the ceramics at 4.2 K and 10 MHz. Preliminary results indicate a dielectric constant of 6-8 and tan δ of 10-2
Keywords :
ceramics; delay lines; dielectric losses; dielectric resonators; niobium compounds; permittivity; solid-state microwave devices; sputtered coatings; superconducting junction devices; superconducting thin films; thick films; type II superconductors; 10 MHz; MgO; Nb; NbN; RF sputtering; SiO2; analog signal processing devices; barrier layers; capacitor electrodes; ceramic dielectrics; dielectric constant; inductor electrode; loss tangent; low-loss microwave delay lines; lumped element resonators; organic-binder burnout step; photolithographic patterning; sintering; thick-film dielectrics; thin-film superconductors; transition temperature; Ceramics; Dielectric devices; Dielectric thin films; Fabrication; Niobium; Signal processing; Sputtering; Superconducting devices; Superconducting thin films; Thin film devices;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92523
Filename :
92523
Link To Document :
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