DocumentCode :
1495157
Title :
Simulating Downscaling of Ohmic Contacts on Wide-Bandgap Low-Resistivity Semiconductors
Author :
Ruzin, A.
Author_Institution :
Sch. of Electr. Eng., Tel Aviv Univ., Tel Aviv, Israel
Volume :
59
Issue :
6
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
1668
Lastpage :
1671
Abstract :
This paper tackles the issue of downscaling of an ohmic contact from the infinite approximation to nanometer dimensions. Using the finite-element simulation program, it is shown that small-size ohmic contacts on a wide-bandgap semiconductor exhibit nonlinear current-voltage dependence in case velocity saturation is introduced. Furthermore, the dependence becomes asymmetrical around zero bias. In addition, it is shown that in small-size contacts, a nonlocal tunneling is bound to occur even in pure ohmic contacts. This may explain the absence of linear I-V curves in the reported experiments with nanometer-scale contacts.
Keywords :
II-VI semiconductors; approximation theory; cadmium compounds; electrical resistivity; finite element analysis; ohmic contacts; tunnelling; wide band gap semiconductors; zinc compounds; Cd1-xZnxTe; downscaling; finite-element simulation; infinite approximation; low-resistivity semiconductors; nanometer dimensions; nonlinear current-voltage dependence; nonlocal tunneling; small-size ohmic contacts; velocity saturation; wide-bandgap semiconductors; Approximation methods; Charge carrier processes; Irrigation; Metals; Ohmic contacts; Radiative recombination; Tunneling; CdZnTe; nanocontacts; ohmic contacts; wide-bandgap semiconductors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2190607
Filename :
6183507
Link To Document :
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