DocumentCode
1495950
Title
A 14 bit 200 MS/s DAC With SFDR >78 dBc, IM3 < -83 dBc and NSD <-163 dBm/Hz Across the Whole Nyquist Band Enabled by Dynamic-Mismatch Mapping
Author
Tang, Yongjian ; Briaire, Joost ; Doris, Kostas ; Van Veldhoven, Robert ; Van Beek, Pieter C W ; Hegt, Hans Johannes A ; Van Roermund, Arthur H M
Author_Institution
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
Volume
46
Issue
6
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
1371
Lastpage
1381
Abstract
This paper presents a 14 bit 200 MS/s current-steering DAC with a novel digital calibration technique called dynamic-mismatch mapping (DMM). By optimizing the switching sequence of current cells to reduce the dynamic integral nonlinearity in an I-Q domain, the DMM technique digitally calibrates all mismatch errors so that both the DAC static and dynamic performance can be significantly improved in a wide frequency range. Compared to traditional current source calibration techniques and static-mismatch mapping, DMM can reduce the distortion caused by both amplitude and timing mismatch errors. Compared to dynamic element matching, DMM does not increase the noise floor since the distortion is reduced, not randomized. The DMM DAC was implemented in a 0.14 μm CMOS technology and achieves a state-of-the-art performance of SFDR >; 78 dBc, IM3 <; -83 dBc and NSD <; -163 dBm/Hz in the whole 100 MHz Nyquist band.
Keywords
calibration; digital-analogue conversion; DAC; Nyquist band; digital calibration technique; dynamic-mismatch mapping; switching sequence; Calibration; Frequency domain analysis; Frequency modulation; Linearity; Switches; Timing; Transfer functions; Calibration; digital-to-analog converter (DAC); dynamic-mismatch mapping (DMM); error measurement; mapping; mismatch; mismatch sensor; switching sequence; timing error;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2011.2126410
Filename
5751593
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