• DocumentCode
    1495950
  • Title

    A 14 bit 200 MS/s DAC With SFDR >78 dBc, IM3 < -83 dBc and NSD <-163 dBm/Hz Across the Whole Nyquist Band Enabled by Dynamic-Mismatch Mapping

  • Author

    Tang, Yongjian ; Briaire, Joost ; Doris, Kostas ; Van Veldhoven, Robert ; Van Beek, Pieter C W ; Hegt, Hans Johannes A ; Van Roermund, Arthur H M

  • Author_Institution
    Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • Volume
    46
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1371
  • Lastpage
    1381
  • Abstract
    This paper presents a 14 bit 200 MS/s current-steering DAC with a novel digital calibration technique called dynamic-mismatch mapping (DMM). By optimizing the switching sequence of current cells to reduce the dynamic integral nonlinearity in an I-Q domain, the DMM technique digitally calibrates all mismatch errors so that both the DAC static and dynamic performance can be significantly improved in a wide frequency range. Compared to traditional current source calibration techniques and static-mismatch mapping, DMM can reduce the distortion caused by both amplitude and timing mismatch errors. Compared to dynamic element matching, DMM does not increase the noise floor since the distortion is reduced, not randomized. The DMM DAC was implemented in a 0.14 μm CMOS technology and achieves a state-of-the-art performance of SFDR >; 78 dBc, IM3 <; -83 dBc and NSD <; -163 dBm/Hz in the whole 100 MHz Nyquist band.
  • Keywords
    calibration; digital-analogue conversion; DAC; Nyquist band; digital calibration technique; dynamic-mismatch mapping; switching sequence; Calibration; Frequency domain analysis; Frequency modulation; Linearity; Switches; Timing; Transfer functions; Calibration; digital-to-analog converter (DAC); dynamic-mismatch mapping (DMM); error measurement; mapping; mismatch; mismatch sensor; switching sequence; timing error;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2011.2126410
  • Filename
    5751593