DocumentCode
1496843
Title
Integer-N PLLs Verification Methodology: Large Signal Steady State and Noise Analysis
Author
Wang, Bo ; Ngoya, Edouard
Author_Institution
Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
Volume
59
Issue
11
fYear
2012
Firstpage
2738
Lastpage
2748
Abstract
The need for accurate and fast verification of the phase locked loop (PLL) circuits is a designers´ important concern before the chip tape-out. This paper covers two major PLL characteristics for circuit verification: steady-state response and phase noise. A new simulation methodology is proposed and comprehensively described. It is general purpose and can be implemented within the framework of all commercial radio frequency integrated circuit (RFIC) simulation tools. By using the new algorithm, we succeed in predicting integer-N PLL´s characteristics with the same precision as the conventional brute-force transistor-level simulation while spending much less time and computer memory. It is composed of two stages, a hierarchical analysis algorithm for the steady state response calculation and a bottom-up behavioral modeling strategy for the phase noise analysis that accurately accounts for the non-idealities in all PLL blocks.
Keywords
phase locked loops; phase noise; radiofrequency integrated circuits; RFIC simulation tools; bottom-up behavioral modeling strategy; brute-force transistor-level simulation; circuit verification; computer memory; hierarchical analysis algorithm; integer-N PLL verification methodology; large signal steady state response analysis; phase locked loop circuit; phase noise analysis; radiofrequency integrated circuit simulation tools; Impedance; Integrated circuit modeling; Load modeling; Noise; Phase locked loops; Steady-state; Voltage-controlled oscillators; Conversion matrix; harmonic balance; phase noise; phase-locked loop; power spectral density; spur; steady state; time-shooting;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2012.2190677
Filename
6184349
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