• DocumentCode
    1496971
  • Title

    Tunable microwave load based on biased photoinduced plasma in silicon

  • Author

    Boyer, Bertrand ; Haidar, Jihad ; Vilcot, Anne ; Bouthinon, Michel

  • Author_Institution
    CNRS, Inst. Nat. Polytech. de Grenoble, France
  • Volume
    45
  • Issue
    8
  • fYear
    1997
  • fDate
    8/1/1997 12:00:00 AM
  • Firstpage
    1362
  • Lastpage
    1367
  • Abstract
    The frequency tuning of a quarter-wave resonator using an optoelectronic control is reported. Sharp notch characteristics with a small decibel-insertion loss and tunable frequency with matching better than 45 dB are obtained by varying both the optical power and the DC bias. The measured frequency shift is more than 60% below the dark resonant frequency and is carried out without altering the shape of the response. The biased photoinduced plasma (BPP) loading the open terminated microstrip line is then analyzed by comparing microwave simulations and measurements. The deduced complex load equivalent to this biased photoinduced plasma is then confirmed by semiconductor simulations. Results show the great possibilities offered by this BPP load (BPPL), which can be easily and widely tuned by means of a simple optoelectronic control. The frequency bandwidth of tuning is limited by the geometrical parameters and may be extended to millimeter-wave operation
  • Keywords
    microwave devices; photoconducting devices; resonators; semiconductor plasma; silicon; tuning; DC bias variation; Si; biased photoinduced plasma; complex load; frequency tuning; insertion loss; microwave simulation; open terminated microstrip line; optical power variation; optoelectronic control; quarter-wave resonator; semiconductor simulations; sharp notch characteristics; tunable frequency; tunable microwave load; Frequency measurement; Microstrip; Optical losses; Optical resonators; Optical tuning; Plasma measurements; Plasma properties; Plasma simulation; Resonant frequency; Shape measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.618437
  • Filename
    618437