Title :
Power penalty in 1.3-μm InP-based strained-layer multiple-quantum-well lasers at elevated temperatures
Author :
Seki, S. ; Yokoyama, K.
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
Abstract :
We present a basic design rule for reducing the light output power penalty in 1.3-μm InP-based strained layer (SL) multiple-quantum-well (MQW) lasers at elevated temperatures. The power penalty is shown to have a strong correlation with a critical temperature (T/sub c/): above T/sub c/, the power penalty rapidly increases due to a significant reduction in differential quantum efficiency. It is indicated that T/sub c/ can be estimated for an arbitrary laser structure by using a self-consistent numerical method. We show that, to minimize the power penalty, it is essential to design an SL-MQW laser so that its T/sub c/ is larger than the required maximum operation temperature.
Keywords :
III-V semiconductors; indium compounds; laser theory; laser transitions; optical design techniques; quantum well lasers; semiconductor device models; 1.3 mum; InP; InP-based strained-layer multiple-quantum-well lasers; SL-MQW laser; basic design rule; critical temperature; differential quantum efficiency; elevated temperatures; light output power penalty; maximum operation temperature; self-consistent numerical method; Fiber lasers; Laser modes; Power generation; Power lasers; Quantum well devices; Semiconductor lasers; Temperature dependence; Temperature distribution; Temperature sensors; Threshold current;
Journal_Title :
Photonics Technology Letters, IEEE