• DocumentCode
    1497465
  • Title

    Semiconcurrent error detection in data paths

  • Author

    Antola, Anna ; Ferrandi, Fabrizio ; Piuri, Vincenzo ; Sami, Mariagiovanna

  • Author_Institution
    Dept. of Electron. & Inf., Politecnico di Milano, Italy
  • Volume
    50
  • Issue
    5
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    449
  • Lastpage
    465
  • Abstract
    A high-level synthesis strategy is proposed for design of semiconcurrently self-checking devices. Attention is mainly focused on data path design. After identifying the reference architecture against which cost and performance are evaluated, a simultaneous scheduling-and-allocation strategy is presented for linear-code data flow graphs, allowing resource sharing between nominal and checking data paths. The proposed strategy is actually independent from a specific scheduling-and-allocation algorithm since it is essentially concerned with the introduction of the fault tolerance issue at high-abstraction level in any design environment. Conventional duplication with comparison, even if considered in a high-level synthesis strategy, leads to high circuit complexity increase. The proposed approach provides that the required checking periodicity is satisfied while minimizing additional functional units by means of maximum reuse of the resources available for the nominal computation as long as error detection ability is preserved. The strategy is then extended to deal with branches and loops in the data path. Risk of error aliasing due to resource sharing is analyzed
  • Keywords
    circuit complexity; data flow graphs; error detection; fault tolerant computing; high level synthesis; checking periodicity; data paths; error aliasing; fault tolerance; high-level synthesis; high-level synthesis strategy; linear-code data flow graphs; reference architecture; resource sharing; scheduling-and-allocation algorithm; semiconcurrent error detection; semiconcurrently self-checking devices; simultaneous scheduling-and-allocation strategy; Circuit faults; Circuit testing; Costs; Fault detection; Fault tolerance; Flow graphs; High level synthesis; Life testing; Resource management; Scheduling algorithm;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.926159
  • Filename
    926159