DocumentCode
1499348
Title
Ferromagnetic Thin Film Noise Suppressor Integrated to On-Chip Transmission Lines
Author
Yamaguchi, Masahiro ; Muroga, Sho ; Endo, Yasushi ; Suzuki, Mitsuru ; Inagaki, Takayoshi ; Mitsuzuka, Yoshio
Author_Institution
Dept. of Electr. & Commun. Eng., Tohoku Univ., Miyagi, Japan
Volume
46
Issue
6
fYear
2010
fDate
6/1/2010 12:00:00 AM
Firstpage
2450
Lastpage
2453
Abstract
This paper studies the effects of integrating soft magnetic films to a 0.15 ¿m rule Silicon-On-Insulator (SOI)-CMOS on-chip microstrip line and coplanar line. In microstrip lines, the intensity of ferromagnetic resonance loss increases with increase in the distance between the magnetic film and ground plane because the magnetic fields from the signal and ground lines are mutually opposite; also, the counter field from the ground current becomes weaker according to distance of the ground plane from the magnetic film. For that reason, it is good to locate the signal line close to the magnetic film and the ground line far away. Furthermore, greater loss occurs with a coplanar line than with microstrip line because both the signal and ground line currents contribute to loss generation.
Keywords
coplanar transmission lines; electromagnetic compatibility; ferromagnetic materials; ferromagnetic resonance; interference suppression; magnetic thin films; microstrip circuits; microstrip lines; silicon-on-insulator; SOI; Si; coplanar line; ferromagnetic resonance loss; ferromagnetic thin film; microstrip line; noise suppressor; on-chip transmission lines; silicon-on-insulator; size 0.15 mum; soft magnetic films; Coplanar transmission lines; Counting circuits; Magnetic fields; Magnetic films; Magnetic noise; Magnetic resonance; Microstrip; Silicon on insulator technology; Transistors; Transmission lines; Electromagnetic compatibility (EMC); Joule loss; electromagnetic noise suppressor; ferromagnetic resonance (FMR) loss; on-chip transmission line; thin films;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2010.2044763
Filename
5467583
Link To Document