• DocumentCode
    1499348
  • Title

    Ferromagnetic Thin Film Noise Suppressor Integrated to On-Chip Transmission Lines

  • Author

    Yamaguchi, Masahiro ; Muroga, Sho ; Endo, Yasushi ; Suzuki, Mitsuru ; Inagaki, Takayoshi ; Mitsuzuka, Yoshio

  • Author_Institution
    Dept. of Electr. & Commun. Eng., Tohoku Univ., Miyagi, Japan
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    2450
  • Lastpage
    2453
  • Abstract
    This paper studies the effects of integrating soft magnetic films to a 0.15 ¿m rule Silicon-On-Insulator (SOI)-CMOS on-chip microstrip line and coplanar line. In microstrip lines, the intensity of ferromagnetic resonance loss increases with increase in the distance between the magnetic film and ground plane because the magnetic fields from the signal and ground lines are mutually opposite; also, the counter field from the ground current becomes weaker according to distance of the ground plane from the magnetic film. For that reason, it is good to locate the signal line close to the magnetic film and the ground line far away. Furthermore, greater loss occurs with a coplanar line than with microstrip line because both the signal and ground line currents contribute to loss generation.
  • Keywords
    coplanar transmission lines; electromagnetic compatibility; ferromagnetic materials; ferromagnetic resonance; interference suppression; magnetic thin films; microstrip circuits; microstrip lines; silicon-on-insulator; SOI; Si; coplanar line; ferromagnetic resonance loss; ferromagnetic thin film; microstrip line; noise suppressor; on-chip transmission lines; silicon-on-insulator; size 0.15 mum; soft magnetic films; Coplanar transmission lines; Counting circuits; Magnetic fields; Magnetic films; Magnetic noise; Magnetic resonance; Microstrip; Silicon on insulator technology; Transistors; Transmission lines; Electromagnetic compatibility (EMC); Joule loss; electromagnetic noise suppressor; ferromagnetic resonance (FMR) loss; on-chip transmission line; thin films;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2044763
  • Filename
    5467583