• DocumentCode
    1500167
  • Title

    ARXPS, SEM, and SAM studies of highly textured YBa2Cu 3Ox films

  • Author

    Halbritter, J. ; Hauser, B. ; Keim, E.G. ; Mathes, H.-J. ; Walk, P. ; Rogalla, H.

  • Author_Institution
    Kernsforschungszentrum Karlsruhe GmbH, West Germany
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    2328
  • Lastpage
    2332
  • Abstract
    The electric conduction in the new cuprate superconductors suffers from intragrain and intergrain weak links. In transition metal oxides weak links show up in a specific chemistry, which can be measured by X-ray photoelectron spectroscopy and by Auger electron spectroscopy. To measure a defective local chemistry, the chemical signature of the reaction cinder has to be identified and the chemical signature of the perfect crystal has to be established. For highly textured cuprate films this has been done successfully, yielding the signature of the reaction cinder, e.g. BaO2 or graphite, the signature of the interface reactions, e.g. Ba-aluminate on Al2O3 or Cu diffusion into MgO, and the signature of c-axis surfaces being a BaOx layer on YBa2Cu3Ox, which results in a 1-nm-thick insulating layer
  • Keywords
    Auger effect; X-ray photoelectron spectra; barium compounds; high-temperature superconductors; scanning electron microscope examination of materials; superconducting thin films; yttrium compounds; ARXPS; Al2O3; Auger electron spectroscopy; Ba-aluminate; BaO2; BaOx layer; Cu diffusion; MgO; SAM studies; SEM; X-ray photoelectron spectroscopy; YBa2Cu3Ox films; c-axis surfaces; cuprate superconductors; defective local chemistry; electric conduction; graphite; high temperature superconductors; highly textured films; interface reactions; intergrain weak links; intragrain weak links; reaction cinder; Charge carrier processes; Chemicals; Chemistry; Conductors; Grain boundaries; Insulation; Scanning electron microscopy; Spectroscopy; Surface cleaning; Surface texture;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92775
  • Filename
    92775