DocumentCode :
1500361
Title :
Investigation of the multilayer deposited BiSrCaCuO thin films
Author :
Jie, B.B. ; Wang, S.L. ; Bao, Z.L. ; Wang, F.R. ; Li, C.Y. ; Li, G. ; Wang, S.Z. ; Yin, D.L.
Author_Institution :
Peking Univ., Beijing, China
Volume :
25
Issue :
2
fYear :
1989
fDate :
3/1/1989 12:00:00 AM
Firstpage :
2448
Lastpage :
2450
Abstract :
Superconducting BiSrCaCuO thin films with zero resistivity at 80 K have been prepared by a multilayer deposition and diffusion method. The nominal composition is BiSrCaCu2Oy. X-ray diffraction shows that the same lattice structure as for the bulk material but with strong preferred orientation in the film. The superconductivity of this kind of film is sensitive to treatment temperature but not sensitive to annealing atmosphere. Critical parameters have been measured and compared with the similar YBaCuO thin films
Keywords :
X-ray diffraction examination of materials; annealing; bismuth compounds; calcium compounds; crystal orientation; high-temperature superconductors; strontium compounds; superconducting thin films; superconducting transition temperature; vapour deposition; 80 K; BiSrCaCuO; X-ray diffraction; annealing atmosphere; critical parameters; diffusion method; high temperature superconductor; lattice structure; multilayer deposited BiSrCaCuO thin films; nominal composition; strong preferred orientation; treatment temperature; zero resistivity; Conductivity; Lattices; Nonhomogeneous media; Sputtering; Superconducting films; Superconducting materials; Superconducting thin films; Superconductivity; Temperature sensors; X-ray diffraction;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.92802
Filename :
92802
Link To Document :
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