DocumentCode
15004
Title
Toward Integrated Scene Text Reading
Author
Weinman, Jerod J. ; Butler, Zachary ; Knoll, D. ; Feild, Jacqueline
Author_Institution
Dept. of Comput. Sci., Grinnell Coll., Grinnell, IA, USA
Volume
36
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
375
Lastpage
387
Abstract
The growth in digital camera usage combined with a worldly abundance of text has translated to a rich new era for a classic problem of pattern recognition, reading. While traditional document processing often faces challenges such as unusual fonts, noise, and unconstrained lexicons, scene text reading amplifies these challenges and introduces new ones such as motion blur, curved layouts, perspective projection, and occlusion among others. Reading scene text is a complex problem involving many details that must be handled effectively for robust, accurate results. In this work, we describe and evaluate a reading system that combines several pieces, using probabilistic methods for coarsely binarizing a given text region, identifying baselines, and jointly performing word and character segmentation during the recognition process. By using scene context to recognize several words together in a line of text, our system gives state-of-the-art performance on three difficult benchmark data sets.
Keywords
document image processing; image motion analysis; image recognition; image segmentation; image sensors; probability; character segmentation; curved layouts; digital camera usage; document processing; integrated scene text reading; motion blur; occlusion; pattern recognition; perspective projection; probabilistic methods; unconstrained lexicons; word segmentation; worldly text abundance; Character recognition; Hidden Markov models; Image segmentation; Noise; Probabilistic logic; Robustness; Text recognition; Scene text recognition; baseline estimation; character recognition; cropped word recognition; discriminative semi-Markov model; image binarization; skew detection; text guidelines; word normalization; word segmentation;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2013.126
Filename
6549105
Link To Document