Title :
Electronic noise in Ba2YCu3O7 films at high temperatures: a possible connection to stress relaxation
Author :
Davidson, A. ; Pedersen, N.F. ; Palevski, A. ; Scheuermann, M.R.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
3/1/1989 12:00:00 AM
Abstract :
Two types of electronic noise have been observed in Ba2YCu3O7 at high temperature. One type is probably due to temperature and pressure fluctuations in the environment of the sample. Because of the known sensitivity of Ba2 YCu3O7 resistance to both temperature and pressure, this mechanism translates into 10 to 100 nV per root Hz of noise at temperatures above 750 K. The second type is more intrinsic, and may be related to stress relaxation in the film induced by the structural changes associated with the orthorhombic-tetragonal transition near 950 K
Keywords :
barium compounds; high-temperature superconductors; internal stresses; noise; solid-state phase transformations; superconducting thin films; yttrium compounds; Ba2YCu3O7; electronic noise; high temperature superconductors; orthorhombic-tetragonal transition; stress relaxation; Atmosphere; Background noise; Bandwidth; Fluctuations; Noise figure; Noise measurement; Temperature; Thermal stresses; Voltage; Working environment noise;
Journal_Title :
Magnetics, IEEE Transactions on
