• DocumentCode
    1502003
  • Title

    Effect of Thickness and Radial Position of Aperture in a Pole Piece in Focusing of Multibeam Electron Gun

  • Author

    Nehra, Ashok ; Sharma, R.K. ; Kumar, Dheeraj ; Choyal, Yaduvendra

  • Author_Institution
    Central Electron. Eng. Res. Inst., Council of Sci. & Ind. Res., Pilani, India
  • Volume
    40
  • Issue
    6
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    1672
  • Lastpage
    1677
  • Abstract
    A four-beam electron gun has been designed using OPerating environment for Electromagnetic Research and Analysis (OPERA) 3-D to demonstrate the dependence of beam focusing on the thickness and the radial position of anode aperture in a pole piece with reference to the gun axis. The study is important in the sense that focusing the off-axis electron beamlets are a bit difficult with a common focusing system. The OPERA simulated results have been also compared with computer simulation technique simulated results. An example of four-beam electron gun to deliver a total of 428-mA (107 4) current at 6-kV beam voltage has been considered for carrying out the aforementioned study. The four electron beamlets are generated through four individual cathodes, surrounded by electrically isolated four beam focusing electrode and corresponding four individual anodes and a common focusing system.
  • Keywords
    electron beam focusing; electron guns; particle beam dynamics; OPERA simulation method; Operating environment for Electromagnetic Research and Analysis; beam focusing dependence; common focusing system; computer simulation technique; current 428 mA; electrically isolated four beam focusing electrode; four-beam electron gun; multibeam electron gun; off-axis electron beamlets; radial aperture position; thickness effect; voltage 6 kV; Apertures; Cathodes; Focusing; Klystrons; Particle beams; Saturation magnetization; Solenoids; Electron gun; multibeam; pole-piece aperture; solenoid focusing;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2012.2192504
  • Filename
    6189082