Title :
An Empirical Phase-Noise Model for MEMS Oscillators Operating in Nonlinear Regime
Author :
Pardo, Mauricio ; Sorenson, Logan ; Ayazi, Farrokh
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
5/1/2012 12:00:00 AM
Abstract :
Nonlinearity of a silicon resonator can lead to improved phase-noise performance in an oscillator when the phase shift of the sustaining amplifier forces the operating point to a steeper phase-frequency slope. As a result, phase modulation on the oscillator frequency is minimized because the resonator behaves as a high-order phase filter. The effect of the increased filtering translates into phase-noise shaping that reflects superior overall performance. Nonlinear effects in MEMS oscillators can be induced via sufficient driving power, generating low-frequency nonwhite noise processes that need to be considered in a phase-noise description. Since the phase-frequency response is not symmetric for a nonlinear detuned resonator, an empirical model based on power series is proposed to describe its effect in the noise sources and to account for the observed higher effective quality factor of the oscillator, the reduction in the corner frequency, and elevated levels of flicker noise very close-to-carrier. The applicability of the presented phase-noise model is shown for three piezoelectric MEMS oscillators, producing a relative fitting error below 1% in all cases.
Keywords :
Q-factor; amplifiers; flicker noise; frequency response; micromechanical resonators; oscillators; phase modulation; phase noise; piezoelectric oscillations; silicon; MEMS resonator; Si; amplifier; corner frequency; flicker noise; high-order phase filter; low-frequency nonwhite noise process; noise source; nonlinear effect; nonlinear regime; oscillator frequency; phase modulation; phase shift; phase-frequency response; phase-frequency slope; phase-noise model; phase-noise performance; phase-noise shaping; piezoelectric MEMS oscillator; power series; quality factor; Mathematical model; Micromechanical devices; Noise; Oscillators; Resonant frequency; Silicon; Transfer functions; Detuning; MEMS resonator; frequency-phase transfer function; nonlinearity; power-series-based PN model;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2012.2195129