• DocumentCode
    1503733
  • Title

    Digital Calibration of Nonlinear Memory Errors in Sigma–Delta Modulators

  • Author

    Lee, Seung-Chul ; Chiu, Yun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • Volume
    57
  • Issue
    9
  • fYear
    2010
  • Firstpage
    2462
  • Lastpage
    2475
  • Abstract
    A digital adaptive calibration technique to linearize sigma-delta (ΣΔ) modulators based on an output-referred distortion analysis of discrete-time integrators (DTIs) is presented. A sequential power series (a special form of Volterra series) is found sufficient to model the nonlinear memory errors in a DTI, which entails the application of adaptive polynomial transversal filtering for error correction of the modulator. Error-parameter identification is accomplished by correlating various moments of the digital output with a 1-bit pseudorandom noise, which is injected into the analog input of each DTI of the modulator. Simulations demonstrate the effectiveness of the technique in compensating the signal-dependent errors of first- and second-order ΣΔ modulators.
  • Keywords
    calibration; nonlinear distortion; sigma-delta modulation; digital adaptive calibration; discrete-time integrators; nonlinear memory errors; output-referred distortion analysis; sigma-delta modulators; Calibration; Diffusion tensor imaging; Digital modulation; Error correction; Low-noise amplifiers; Multi-stage noise shaping; Nonlinear distortion; Signal processing; Signal to noise ratio; Testing; $SigmaDelta$ modulator; Analog-to-digital converter (ADC); correlation; digital calibration; low-gain amplifier; memory error; nonlinear distortion; quantization noise leakage; test signal;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2010.2046243
  • Filename
    5473087