DocumentCode
1503733
Title
Digital Calibration of Nonlinear Memory Errors in Sigma–Delta Modulators
Author
Lee, Seung-Chul ; Chiu, Yun
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume
57
Issue
9
fYear
2010
Firstpage
2462
Lastpage
2475
Abstract
A digital adaptive calibration technique to linearize sigma-delta (ΣΔ) modulators based on an output-referred distortion analysis of discrete-time integrators (DTIs) is presented. A sequential power series (a special form of Volterra series) is found sufficient to model the nonlinear memory errors in a DTI, which entails the application of adaptive polynomial transversal filtering for error correction of the modulator. Error-parameter identification is accomplished by correlating various moments of the digital output with a 1-bit pseudorandom noise, which is injected into the analog input of each DTI of the modulator. Simulations demonstrate the effectiveness of the technique in compensating the signal-dependent errors of first- and second-order ΣΔ modulators.
Keywords
calibration; nonlinear distortion; sigma-delta modulation; digital adaptive calibration; discrete-time integrators; nonlinear memory errors; output-referred distortion analysis; sigma-delta modulators; Calibration; Diffusion tensor imaging; Digital modulation; Error correction; Low-noise amplifiers; Multi-stage noise shaping; Nonlinear distortion; Signal processing; Signal to noise ratio; Testing; $SigmaDelta$ modulator; Analog-to-digital converter (ADC); correlation; digital calibration; low-gain amplifier; memory error; nonlinear distortion; quantization noise leakage; test signal;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2010.2046243
Filename
5473087
Link To Document