DocumentCode :
1503983
Title :
Improved Fine-Scale Laser Mapping of Component SEE Sensitivity
Author :
Chugg, Andrew M. ; Ward, Jonathan ; McIntosh, James ; Flynn, Nathan ; Duncan, Peter H. ; Barber, Thomas S. ; Poivey, Christian
Author_Institution :
Radiation Effects Group, MBDA UK Ltd., Filton, Bristol, UK
Volume :
59
Issue :
4
fYear :
2012
Firstpage :
1007
Lastpage :
1014
Abstract :
We have devised, implemented and demonstrated new scanning technology, smoother (uninterrupted) scanning algorithms and a capability to read selectable sub-sections of memory devices in order to accelerate laser SEE testing and address descrambling for interpreting MCU´s and burst errors.
Keywords :
Acceleration; Laser beams; Microchip lasers; Sensitivity; Spirals; Trajectory; Piezoelectric transducers; pulsed lasers; semiconductor device radiation effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2189582
Filename :
6190733
Link To Document :
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