Title :
Improved Fine-Scale Laser Mapping of Component SEE Sensitivity
Author :
Chugg, Andrew M. ; Ward, Jonathan ; McIntosh, James ; Flynn, Nathan ; Duncan, Peter H. ; Barber, Thomas S. ; Poivey, Christian
Author_Institution :
Radiation Effects Group, MBDA UK Ltd., Filton, Bristol, UK
Abstract :
We have devised, implemented and demonstrated new scanning technology, smoother (uninterrupted) scanning algorithms and a capability to read selectable sub-sections of memory devices in order to accelerate laser SEE testing and address descrambling for interpreting MCU´s and burst errors.
Keywords :
Acceleration; Laser beams; Microchip lasers; Sensitivity; Spirals; Trajectory; Piezoelectric transducers; pulsed lasers; semiconductor device radiation effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2012.2189582
