DocumentCode :
1506097
Title :
Basic expressions and approximations in small-signal parameter extraction for HBT´s
Author :
Li, Bin ; Prasad, Sheila
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume :
47
Issue :
5
fYear :
1999
fDate :
5/1/1999 12:00:00 AM
Firstpage :
534
Lastpage :
539
Abstract :
Basic expressions and approximations used to extract small-signal parameters for heterojunction bipolar transistors or bipolar junction transistors are developed in this paper. A T-type small-signal equivalent circuit after deembedding the pad capacitances is used for the derivation. The relative magnitudes of ωRbcCbe , ωRbiCbc, and ωrcC bell were used to evaluate the frequency ranges. Fully numerical or partially numerical approaches can be developed by these approximations. An element parameter-extraction procedure is also given in this paper. Two special cases (“cold” bias and degrading equivalent circuits) are also discussed
Keywords :
capacitance; equivalent circuits; heterojunction bipolar transistors; HBT; T-type small-signal equivalent circuit; cold bias; degrading equivalent circuits; element parameter-extraction procedure; frequency ranges; heterojunction bipolar transistors; pad capacitance deembedding; small-signal parameter extraction; Bipolar transistors; Capacitance; Contact resistance; Data mining; Degradation; Design optimization; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Parameter extraction;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.763151
Filename :
763151
Link To Document :
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