• DocumentCode
    15067
  • Title

    Boost Converter With SiC JFETs: Comparison With CoolMOS and Tests at Elevated Case Temperature

  • Author

    Guedon, F. ; Singh, Sushil ; McMahon, R. ; Udrea, F.

  • Author_Institution
    Department of Engineering, University of Cambridge, Cambridge, U.K.
  • Volume
    28
  • Issue
    4
  • fYear
    2013
  • fDate
    Apr-13
  • Firstpage
    1938
  • Lastpage
    1945
  • Abstract
    The emergence of hybrid electric vehicles (HEVs) has driven an increasing demand for high power densities in power converters. Silicon carbide (SiC) is a candidate of choice to meet this demand, and it has, therefore, been the object of a growing interest over the past decade. The boost converter (step-up converter) is an essential part of the typical powertrain of an HEV. This paper presents a scaled experiment in which a boost converter with a SiCjunction field-effect transistor is compared to the same converter with a silicon (Si) superjunction metal oxide semiconductor field-effect transistor (MOSFET). In a first part, classic heatsinks are used; in a second part, the case of the transistors is maintained at 105 ^{\\circ} C to mimic a cooling by radiator water. In both cases, results show a clear advantage for SiC.
  • Keywords
    JFETs; Junctions; Logic gates; Silicon; Silicon carbide; Temperature measurement; Boost converter; CoolMOS; SiC junction field-effect transistor (JFET); elevated temperature;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2012.2201753
  • Filename
    6208891