DocumentCode
15067
Title
Boost Converter With SiC JFETs: Comparison With CoolMOS and Tests at Elevated Case Temperature
Author
Guedon, F. ; Singh, Sushil ; McMahon, R. ; Udrea, F.
Author_Institution
Department of Engineering, University of Cambridge, Cambridge, U.K.
Volume
28
Issue
4
fYear
2013
fDate
Apr-13
Firstpage
1938
Lastpage
1945
Abstract
The emergence of hybrid electric vehicles (HEVs) has driven an increasing demand for high power densities in power converters. Silicon carbide (SiC) is a candidate of choice to meet this demand, and it has, therefore, been the object of a growing interest over the past decade. The boost converter (step-up converter) is an essential part of the typical powertrain of an HEV. This paper presents a scaled experiment in which a boost converter with a SiCjunction field-effect transistor is compared to the same converter with a silicon (Si) superjunction metal oxide semiconductor field-effect transistor (MOSFET). In a first part, classic heatsinks are used; in a second part, the case of the transistors is maintained at 105
C to mimic a cooling by radiator water. In both cases, results show a clear advantage for SiC.
Keywords
JFETs; Junctions; Logic gates; Silicon; Silicon carbide; Temperature measurement; Boost converter; CoolMOS; SiC junction field-effect transistor (JFET); elevated temperature;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2012.2201753
Filename
6208891
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