• DocumentCode
    15069
  • Title

    Linearization Technique for Binary Phase Detectors in a Collaborative Timing Recovery Circuit

  • Author

    Byoung-Joo Yoo ; Woo-Rham Bae ; Jiho Han ; Jaeha Kim ; Deog-Kyoon Jeong

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • Volume
    22
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    1226
  • Lastpage
    1237
  • Abstract
    A multichannel clock and data recovery (CDR) circuit that employs binary phase detectors (PDs) yet achieves linear loop dynamics is presented. The proposed CDR recovers the linear information of phase errors by exploiting its collaborative timing recovery architecture. Since the collaborative CDR combines the PD outputs of the multiple data streams, a deliberate phase offset can be added to each PD to realize a high-rate oversampling PD without additional PDs. The analysis shows that there exists an optimal spacing between these deliberate phase offsets that maximizes the linearity of the proposed PD for given jitter conditions. Under these conditions, the loop dynamics of a linear, second-order CDR model agree well with the simulated responses even with a finite latency difference between the proportional and integral control paths. The linearized characteristics of the PD and the overall CDR designed for 45-nm CMOS technology are, respectively, verified by using a time-step accurate behavioral simulation.
  • Keywords
    CMOS integrated circuits; clock and data recovery circuits; linearisation techniques; phase detectors; synchronisation; timing circuits; CMOS technology; binary phase detectors; collaborative timing recovery circuit; finite latency difference; linear information; linear loop dynamics; linearization technique; multichannel clock and data recovery circuit; phase errors; size 45 nm; Binary phase detector (PD); clock and data recovery circuit (CDR); digital control; linearization techniques; serial link; serial link.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2013.2269616
  • Filename
    6549110