• DocumentCode
    1507608
  • Title

    AlGaN/GaN HEMTs grown on SiC substrates

  • Author

    Binari, S.C. ; Redwing, J.M. ; Kelner, G. ; Kruppa, W.

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    33
  • Issue
    3
  • fYear
    1997
  • fDate
    1/30/1997 12:00:00 AM
  • Firstpage
    242
  • Lastpage
    243
  • Abstract
    The fabrication and characterisation of AlGaN/GaN HEMTs grown on SiC substrates are described. These devices have a transconductance of 70 mS/mm and a gate breakdown voltage in excess of 100V. The HEMTs have a hard pinch-off with nearly ideal subthreshold characteristics. An f T of 6 GHz and an fmax of 11 GHz were measured for 1 μm gate length devices
  • Keywords
    III-V semiconductors; aluminium compounds; characteristics measurement; electron mobility; gallium compounds; power HEMT; 1 micron; 11 GHz; 6 GHz; AlGaN-GaN; HEMTs; SiC; gate breakdown voltage; gate length; hard pinch-off; nearly ideal subthreshold characteristics; transconductance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970122
  • Filename
    575959