DocumentCode
1509482
Title
Thickness gauge uses electron beam
Volume
81
Issue
3
fYear
1962
fDate
3/1/1962 12:00:00 AM
Firstpage
215
Lastpage
215
Abstract
A new thickness gauge, intended for use in industry for inspection and quality control, is at the prototype stage. Called an electron probe thickness gauge, it rapidly and nondestructively measures electroplates, ceramic enamels, and organic coatings. It detects deviations from specifications as small as 1 per cent in platings, sheet, films, or laminations. The chemical composition of the layer need be known only roughly.
Keywords
Computers; Electron beams; Laser excitation; Laser radar; Pain; Power lasers; Thickness measurement;
fLanguage
English
Journal_Title
Electrical Engineering
Publisher
ieee
ISSN
0095-9197
Type
jour
DOI
10.1109/EE.1962.6446792
Filename
6446792
Link To Document