Title :
Surface Modification of Si Wafer by Low-Pressure High-Frequency Plasma Chemical Vapor Deposition Method
Author :
Yuji, Toshifumi ; Mungkung, Narong ; Kiyota, Yuichi ; Uesugi, Daishiro ; Kawano, Minobu ; Nakabayashi, Kenichi ; Kataoka, Hisaaki ; Suzaki, Yoshifumi ; Kashihara, Nobuki ; Akatsuka, Hiroshi
Author_Institution :
Fac. of Educ. & Culture, Univ. of Miyazaki, Miyazaki, Japan
fDate :
6/1/2011 12:00:00 AM
Abstract :
In recent years, a flexible type of solar cell that can maintain various shape changes and that is applicable to virtually all products has attracted global attention. In the present research, we describe equipment for the production of thin-film material for flexible type solar cells that uses a high-frequency plasma chemical vapor deposition (CVD) method. This equipment is now at the development stage, and in order to clarify the cardinal trait of the plasma, we performed a plasma treatment on the surface of a Si wafer. Using X-ray photoelectron spectroscopy and contact angle meter measurements, we identified one index that clarifies the simple cardinal trait of plasma CVD.
Keywords :
X-ray photoelectron spectra; contact angle; elemental semiconductors; high-frequency effects; plasma CVD; plasma pressure; silicon; solar cells; Si; X-ray photoelectron spectroscopy; contact angle; low-pressure high-frequency plasma chemical vapor deposition; solar cell; surface modification; thin-film material; Argon; Education; Photovoltaic cells; Plasmas; Silicon; Surface treatment; Argon $+$ oxygen mixture gas; MirroTron sputtering method; Poly (ethylene naphthalate) film; solar cell; thin films;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2011.2140383