Author :
Huang, Qin ; Huisken, J.A.
Author_Institution :
Swiss Federal Institute of Technology
fDate :
7/1/2001 12:00:00 AM
Keywords :
Base stations; CMOS technology; Electrostatic discharge; MOSFET circuits; Noise measurement; Protection; Radio frequency; Radio transmitters; Radiofrequency amplifiers; Substrates;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2001.933454
