Title :
Analysis on reverse recovery characteristic of SiC MOSFET intrinsic diode
Author :
Zhaohui Wang ; Jiajia Ouyang ; Junming Zhang ; Xinke Wu ; Kuang Sheng
Author_Institution :
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
Abstract :
Different from IGBT, SiC MOSFET can operate as synchronous rectifier with low on resistance, thus the intrinsic diode only work during the dead time. To utilize the intrinsic diode as freewheeling diode, the reverse recovery characteristic is analyzed and discussed in this paper. Four operating conditions, i.e. turn-off voltage, forward current, current commutating slope and junction temperature, are considered to evaluate the turn-off performance of SiC MOSFET intrinsic diode. To test the device and minimize the stray inductance, a double pulse test bench based on direct bond copper substrate and bare dies is designed. The reverse recovery feature of two kinds of silicon p-i-n diode is also tested for comparison. The experimental results show that the intrinsic diode is sensitive to the junction temperature and the performance gets worse at high temperature, but still much better than silicon p-i-n diode.
Keywords :
carbon compounds; elemental semiconductors; p-i-n diodes; power MOSFET; rectifiers; silicon compounds; SiC MOSFET intrinsic diode; bare dies; current commutating slope; direct bond copper substrate; double pulse test bench; forward current; freewheeling diode; junction temperature; reverse recovery characteristic analysis; reverse recovery feature; silicon p-i-n diode; stray inductance minimization; synchronous rectifier; turn-off performance evaluation; turn-off voltage; Junctions; Logic gates; MOSFET; P-i-n diodes; Resistance; Schottky diodes; Silicon carbide;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
Conference_Location :
Pittsburgh, PA
DOI :
10.1109/ECCE.2014.6953782