Title :
Data parallel fault simulation
Author :
Amin, Minesh B. ; Vinnakota, Bapiraju
Author_Institution :
Synopsys, Mountain View, CA, USA
fDate :
6/1/1999 12:00:00 AM
Abstract :
Fault simulation is a computer-intensive problem. Parallel processing is one method to reduce simulation time. In this paper, we discuss a technique to partition the fault set for fault-parallel simulation on multiple processors. When applied statically, the technique can scale well for up to 32 processors. The fault-set partitioning technique is simple and can itself be parallelized. Existing uniprocessor algorithms, based on parallel-pattern simulation, can be used for multiprocessor simulation without modification. Therefore, the techniques can be used effectively on a low-cost parallel resource such as a network of workstations.
Keywords :
fault simulation; logic CAD; logic partitioning; logic simulation; parallel processing; data parallel fault simulation; fault set partitioning; logic gate level; low-cost parallel resource; multiple processors; simulation time; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Electrical fault detection; Integrated circuit testing; Parallel processing; Partitioning algorithms; Workstations;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on