• DocumentCode
    1513411
  • Title

    A variational calculus approach to optimal checkpoint placement

  • Author

    Ling, Yibei ; Mi, Jie ; Lin, Xiaola

  • Author_Institution
    Appl. Res. Lab., Telcodia Technol., Morristown, NJ, USA
  • Volume
    50
  • Issue
    7
  • fYear
    2001
  • fDate
    7/1/2001 12:00:00 AM
  • Firstpage
    699
  • Lastpage
    708
  • Abstract
    Checkpointing is an effective fault-tolerant technique for improving system availability and reliability. However, a blind checkpointing placement can result in either performance degradation or expensive recovery cost. By means of the calculus of variations, we derive an explicit formula that links the optimal checkpointing frequency with a general failure rate, with the objective of globally minimizing the total expected cost of checkpointing and recovery. Theoretical result shows that the optimal checkpointing frequency is proportional to the square root of the failure rate and can be uniquely determined by the failure rate (time-varying or constant) if the recovery function is strictly increasing and the failure rate is λ(∞)>0. J.L. Bruno and E.G. Coffman (1997) suggest that optimal checkpointing by its nature is a function of system failure rate, i.e., the time-varying failure rate demands time-varying checkpointing in order to meet the criteria of certain optimality. The results obtained in this paper agree with their viewpoint
  • Keywords
    fault tolerant computing; system recovery; time-varying systems; variational techniques; checkpointing; fault-tolerant technique; general failure rate; optimal checkpoint placement; optimal checkpointing frequency; performance degradation; reliability; system availability; time-varying checkpointing; time-varying failure rate; variational calculus approach; Availability; Calculus; Checkpointing; Cost function; Databases; Degradation; Fault tolerant systems; Frequency; Mathematical model; Time varying systems;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.936236
  • Filename
    936236