• DocumentCode
    1513421
  • Title

    An hypothesis test technique for determining a difference in sampled parts defective utilizing Fisher´s exact test IC production

  • Author

    Hackerott, Michael ; Urquhart, Andy

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • Volume
    3
  • Issue
    4
  • fYear
    1990
  • fDate
    11/1/1990 12:00:00 AM
  • Firstpage
    247
  • Lastpage
    248
  • Abstract
    The result of sample testing during the production of integrated circuits is often a very small number of parts defective out of a sample which is itself very small compared to its population. The ability to determine a statistically significant difference when comparing the results of two such samples is critical in correctly evaluating the outcome of experiments. Fisher´s exact test can be used in this situation because it is a method for testing the difference between two proportions of parts defective when the proportions are relatively small in comparison to the sample size. The results of the test are very accurate when the populations are at least ten times the sample size. The result of the test is independent of the order of the samples. However, because the test is one-sided, care must be taken to state the alternative hypothesis based upon the order of the magnitudes of the sample fractions defective
  • Keywords
    integrated circuit manufacture; statistical analysis; Fisher´s exact test; IC production; hypothesis test technique; integrated circuits; statistically significant difference; Circuit testing; Integrated circuit testing; Manufacturing processes; Performance evaluation; Postal services; Production; Statistical analysis;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/66.61974
  • Filename
    61974