DocumentCode :
1516275
Title :
Measurements of the polarization dependence of the gain of strained multiple quantum well InGaAs-InP lasers
Author :
Tanbun-Ek, T. ; Olsson, N.A. ; Logan, R.A. ; Wecht, K.W. ; Sergent, A.M.
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
Volume :
3
Issue :
2
fYear :
1991
Firstpage :
103
Lastpage :
105
Abstract :
The polarization-dependent gain spectra of both tensile and compressive strain multiple-quantum-well (MQW) In/sub x/Ga/sub 1-x/As-InP lasers in a relatively large strain regime are presented. The results show that MQW lasers with tensile strain and an In concentration as low as 43% in the wells lase in a pure transverse magnetic (TM) mode rather than a transverse electric (TE) mode with a gain difference of 60-70 cm/sup -1/ at all the injection currents investigated. The peak gain for the TE mode is shifted toward shorter wavelengths from that of the TM mode, indicating that the emission is principally due to light hole-electron transition. The differential gain of the TM mode is about 1.5 times higher than that of the TE mode operation. Opposite phenomena were observed in the compressive strained MQW lasers.<>
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; light polarisation; semiconductor junction lasers; In concentration; MQW lasers; compressive strain; differential gain; diode laser gain polarisation dependence measurement; gain spectra; injection currents; light hole-electron transition; peak gain; pure TM mode lasing; semiconductor; strained multiple quantum well InGaAs-InP lasers; tensile strain; Gain measurement; Laser modes; Laser transitions; Optical polarization; Power lasers; Quantum well devices; Quantum well lasers; Strain measurement; Tellurium; Tensile strain;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.76854
Filename :
76854
Link To Document :
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