Title :
On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
7/1/2010 12:00:00 AM
Abstract :
We demonstrate that undetectable single stuck-at faults in full-scan benchmark circuits tend to cluster in certain areas. This implies that certain areas may remain uncovered by a test set for single stuck-at faults. We describe an extension to the set of target faults aimed at providing a better coverage of the circuit in the presence of undetectable single stuck-at faults. The extended set of target faults consists of double stuck-at faults that include an undetectable fault as one of their components. The other component is a detectable fault adjacent to the undetectable fault. We present experimental results of fault simulation and test generation for the extended set of target faults.
Keywords :
benchmark testing; circuit testing; fault diagnosis; pattern clustering; double stuck-at faults; full-scan benchmark circuits; full-scan circuit test quality; undetectable single stuck-at fault clustering; Benchmark testing; Bridge circuits; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Electrical fault detection; Fault detection; Fault diagnosis; Integrated circuit testing; Full-scan; stuck-at faults; test generation; test quality; undetectable faults;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2010.2046448
