• DocumentCode
    1521053
  • Title

    Tunneling Magnetoresistance Properties in Ballistic Spin Field-Effect Transistors

  • Author

    Jiang, Kai-Ming ; Zhang, Rong ; Yang, Jun ; Yue, Chun-Xiao ; Sun, Zu-Yao

  • Author_Institution
    Dept. of Phys., Shanghai Maritime Univ., Shanghai, China
  • Volume
    57
  • Issue
    8
  • fYear
    2010
  • Firstpage
    2005
  • Lastpage
    2012
  • Abstract
    We investigate tunneling magnetoresistance (TMR) properties in ballistic spin field-effect transistors (SFETs) by taking into account the Rashba spin-orbit coupling (SOC), interface scattering, the presence of an in-plane magnetic field, band mismatch, and spin polarization in the ferromagnetic electrodes. It is shown that, for high potential barriers at the contact/channel interfaces, as the band mismatch is varied, the magnitude, amplitude, phase, and sign of the TMR are significantly modulated by the Rashba SOC, whereas the presence of the magnetic field makes the TMR oscillate between positive and negative values. Likewise, in an SFET with ohmic-contact interfaces, the Rashba SOC affects the band mismatch dependence of the TMR in a completely different fashion from the magnetic field. We also study the variation in the TMR when either the Rashba SOC strength or the magnitude or direction of the magnetic field is varied. Our theoretical results may be useful in analyzing experimental data of relevant devices.
  • Keywords
    field effect transistors; ohmic contacts; tunnelling magnetoresistance; Rashba spin-orbit coupling; TMR; ballistic spin field-effect transistors; band mismatch; contact-channel interfaces; ferromagnetic electrodes; in-plane magnetic field; interface scattering; ohmic-contact interfaces; spin polarization; tunneling magnetoresistance properties; Amplitude modulation; Couplings; Electrodes; FETs; Magnetic fields; Magnetic properties; Phase modulation; Polarization; Scattering; Tunneling magnetoresistance; In-plane magnetic field; Rashba spin–orbit coupling (SOC); spin field-effect transistor (SFET); tunneling magnetoresistance (TMR);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2010.2051636
  • Filename
    5491141