DocumentCode
1521053
Title
Tunneling Magnetoresistance Properties in Ballistic Spin Field-Effect Transistors
Author
Jiang, Kai-Ming ; Zhang, Rong ; Yang, Jun ; Yue, Chun-Xiao ; Sun, Zu-Yao
Author_Institution
Dept. of Phys., Shanghai Maritime Univ., Shanghai, China
Volume
57
Issue
8
fYear
2010
Firstpage
2005
Lastpage
2012
Abstract
We investigate tunneling magnetoresistance (TMR) properties in ballistic spin field-effect transistors (SFETs) by taking into account the Rashba spin-orbit coupling (SOC), interface scattering, the presence of an in-plane magnetic field, band mismatch, and spin polarization in the ferromagnetic electrodes. It is shown that, for high potential barriers at the contact/channel interfaces, as the band mismatch is varied, the magnitude, amplitude, phase, and sign of the TMR are significantly modulated by the Rashba SOC, whereas the presence of the magnetic field makes the TMR oscillate between positive and negative values. Likewise, in an SFET with ohmic-contact interfaces, the Rashba SOC affects the band mismatch dependence of the TMR in a completely different fashion from the magnetic field. We also study the variation in the TMR when either the Rashba SOC strength or the magnitude or direction of the magnetic field is varied. Our theoretical results may be useful in analyzing experimental data of relevant devices.
Keywords
field effect transistors; ohmic contacts; tunnelling magnetoresistance; Rashba spin-orbit coupling; TMR; ballistic spin field-effect transistors; band mismatch; contact-channel interfaces; ferromagnetic electrodes; in-plane magnetic field; interface scattering; ohmic-contact interfaces; spin polarization; tunneling magnetoresistance properties; Amplitude modulation; Couplings; Electrodes; FETs; Magnetic fields; Magnetic properties; Phase modulation; Polarization; Scattering; Tunneling magnetoresistance; In-plane magnetic field; Rashba spin–orbit coupling (SOC); spin field-effect transistor (SFET); tunneling magnetoresistance (TMR);
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2010.2051636
Filename
5491141
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