• DocumentCode
    1521233
  • Title

    A new empirical large-signal model of Si LDMOSFETs for high-power amplifier design

  • Author

    Yang, Youngoo ; Woo, Young Yun ; Yi, Jaehyok ; Kim, Bumman

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
  • Volume
    49
  • Issue
    9
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    1626
  • Lastpage
    1633
  • Abstract
    We propose a new empirical large-signal model of silicon laterally diffused MOSFETs for the design of various modes of high-power amplifiers. The new channel current model has only nine parameters that represent the unique operation principles of a MOSFET. In the channel current model, we include the thermal phenomena of high-power devices. To accurately characterize high-power devices, we incorporate the channel heating and heat-sink heating effects by providing two thermal capacitances and two thermal resistances. Nonlinear capacitances, including deep subthreshold and triode regions, as well as normal saturation regions, are extracted and modeled. For validation of our model, a 1.4-GHz 5-W amplifier is implemented, and the measured and simulated results match very well
  • Keywords
    UHF field effect transistors; UHF power amplifiers; capacitance; elemental semiconductors; equivalent circuits; power MOSFET; semiconductor device models; silicon; thermal resistance; 1.4 GHz; 5 W; Si; Si LDMOSFETs; channel current model; channel heating effects; deep subthreshold region; empirical large-signal model; heat-sink heating effects; high-power amplifier design; high-power devices; laterally diffused MOSFETs; nonlinear capacitances extraction; normal saturation regions; thermal capacitances; thermal phenomena; thermal resistances; triode region; Electrical resistance measurement; High power amplifiers; MOSFETs; Power system modeling; Pulse measurements; Radiofrequency amplifiers; Resistance heating; Silicon; Temperature; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.942576
  • Filename
    942576