DocumentCode
1521252
Title
Finite-element analysis of generalized V- and W-shaped edge and broadside-edge-coupled shielded microstrip lines on anisotropic medium
Author
Yan, Yue ; Pramanick, Protap
Author_Institution
Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask., Canada
Volume
49
Issue
9
fYear
2001
fDate
9/1/2001 12:00:00 AM
Firstpage
1649
Lastpage
1657
Abstract
This paper presents detailed finite-element analysis of generalized V- and W-shaped shielded microstrip lines in an anisotropic medium. The computed results show detailed quasistatic characteristics of the effective dielectric constant, characteristic impedance, and conductor loss of the lines. The broadside edge coupled lines are proposed for the first time in this paper. Unlike the previous analysis based on the conformal mapping method, this analysis takes into account the top walls and sidewalls, finite metallization thickness, and dielectric anisotropy. The results presented in this paper will considerable advance microwave-integrated-circuit technology using V- and W-shaped shielded microstrip lines
Keywords
anisotropic media; coupled transmission lines; electric impedance; electromagnetic shielding; finite element analysis; metallisation; microstrip lines; permittivity; transmission line theory; FEM; MIC technology; V-shaped edge-coupled lines; W-shaped edge-coupled lines; anisotropic medium; broadside-edge-coupled lines; characteristic impedance; conductor loss; dielectric anisotropy; effective dielectric constant; finite metallization thickness; finite-element analysis; microwave-integrated-circuit technology; quasistatic characteristics; shielded microstrip lines; sidewalls; top walls; Anisotropic magnetoresistance; Conductors; Conformal mapping; Dielectric constant; Dielectric losses; Finite element methods; Impedance; Metallization; Microstrip; Microwave technology;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.942579
Filename
942579
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