• DocumentCode
    1521252
  • Title

    Finite-element analysis of generalized V- and W-shaped edge and broadside-edge-coupled shielded microstrip lines on anisotropic medium

  • Author

    Yan, Yue ; Pramanick, Protap

  • Author_Institution
    Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask., Canada
  • Volume
    49
  • Issue
    9
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    1649
  • Lastpage
    1657
  • Abstract
    This paper presents detailed finite-element analysis of generalized V- and W-shaped shielded microstrip lines in an anisotropic medium. The computed results show detailed quasistatic characteristics of the effective dielectric constant, characteristic impedance, and conductor loss of the lines. The broadside edge coupled lines are proposed for the first time in this paper. Unlike the previous analysis based on the conformal mapping method, this analysis takes into account the top walls and sidewalls, finite metallization thickness, and dielectric anisotropy. The results presented in this paper will considerable advance microwave-integrated-circuit technology using V- and W-shaped shielded microstrip lines
  • Keywords
    anisotropic media; coupled transmission lines; electric impedance; electromagnetic shielding; finite element analysis; metallisation; microstrip lines; permittivity; transmission line theory; FEM; MIC technology; V-shaped edge-coupled lines; W-shaped edge-coupled lines; anisotropic medium; broadside-edge-coupled lines; characteristic impedance; conductor loss; dielectric anisotropy; effective dielectric constant; finite metallization thickness; finite-element analysis; microwave-integrated-circuit technology; quasistatic characteristics; shielded microstrip lines; sidewalls; top walls; Anisotropic magnetoresistance; Conductors; Conformal mapping; Dielectric constant; Dielectric losses; Finite element methods; Impedance; Metallization; Microstrip; Microwave technology;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.942579
  • Filename
    942579