Title :
10-bit 100-MS/s Pipelined ADC Using Input-Swapped Opamp Sharing and Self-Calibrated V/I Converter
Author :
Kim, Moo-Young ; Kim, Jinwoo ; Lee, Tagjong ; Kim, Chulwoo
Author_Institution :
Electr. & Electron. Eng. Dept., Korea Univ., Seoul, South Korea
Abstract :
A 31 mW, 10-bit 100-MS/s pipelined analog-to-digital converter (ADC), which alleviates the memory effect occurring in the opamp-sharing technique, and automatically corrects the current error of the V/I converter, has been developed. The proposed ADC achieves low-power consumption, high noise immunity, and has a small area, by employing an input-swapped opamp-sharing technique that switches the summing node in an multiplying digital-to-analog converter and a V/I converter with a process, supply voltage, and temperature condition detector. The ADC shows a differential nonlinearity of less than 0.48 LSB, and an integral nonlinearity of less than 0.95 LSB. Also, an signal-to-noise-and-distortion ratio of 56.2 dB is measured with a 1 MHz input frequency. This has been implemented in a 0.18-μm CMOS process, and occupies 1.6 × 0.8 mm2 of active area.
Keywords :
CMOS integrated circuits; analogue-digital conversion; convertors; low-power electronics; operational amplifiers; CMOS process; input swapped opamp sharing; low power consumption; memory effect; opamp sharing technique; pipelined ADC; self calibrated V/I converter; Analog-digital conversion; CMOS process; Detectors; Digital-analog conversion; Error correction; Frequency measurement; Switches; Switching converters; Temperature; Voltage; Opamp-sharing; V/I converter; pipelined analog-to-digital converter (ADC); self-calibration; switched bias;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2010.2050915