DocumentCode :
1525393
Title :
An optimized rapid aluminum back surface field technique for silicon solar cells
Author :
Narasimha, Shreesh ; Rohatgi, Ajeet ; Weeber, A.W.
Author_Institution :
Univ. Center of Excellence for Photo-voltaics Res. & Educ., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
46
Issue :
7
fYear :
1999
fDate :
7/1/1999 12:00:00 AM
Firstpage :
1363
Lastpage :
1370
Abstract :
Screen-printing and rapid thermal annealing have been combined to achieve an aluminum-alloyed back surface field (Al-BSF) that lowers the effective back surface recombination velocity (Seff) to approximately 200 cm/s for solar cells formed on 2.3 Ω-cm Si. Analysis and characterization of the BSF structures show that this formation process satisfies the two main requirements for achieving low Seff: (1) deep p+ regions and (2) uniform junctions. Screen-printing is ideally suited for fast deposition of thick Al films which, upon alloying, result in deep BSF regions. Use of a rapid alloying treatment is shown to significantly improve the BSF junction uniformity and reduce Seff. The Al-BSFs formed by screen-printing and rapid alloying have been integrated into both laboratory and industrial-type fabrication sequences to achieve solar cell efficiencies in excess of 19.0 and 17.0%, respectively, on planar 2.3 Ω-cm float zone Si. For both process sequences, these cell efficiencies are 1-2% (absolute) higher than analogous cells made with unoptimized Al-BSFs or highly recombinative rear surfaces
Keywords :
aluminium; elemental semiconductors; rapid thermal annealing; silicon; solar cells; surface alloying; surface recombination; 17.0 percent; 19.0 percent; Si-Al; aluminium alloying; back surface field; process optimization; rapid thermal annealing; screen printing; silicon solar cell; surface recombination velocity; Alloying; Aluminum; Doping; Laboratories; Photovoltaic cells; Photovoltaic systems; Radiative recombination; Silicon; Solar power generation; Substrates;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.772477
Filename :
772477
Link To Document :
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