The effects of offset voltage on the amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method

Author

Larson, Donald R. ; Paulter, Nicholas G., Jr.

Author_Institution

Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

50

Issue

4

fYear

2001

fDate

8/1/2001 12:00:00 AM

Firstpage

872

Lastpage

876

Abstract

The amplitude and bandwidth of kick-out pulses used in the nose-to-nose sampler impulse response characterization method were measured as a function of offset voltage. The measuring instrument was of similar bandwidth and its effects on the measurement were not removed. The amplitude is almost linear for offset voltages from -500 mV to 500 mV, except for values from about -50 mV to 50 mV. Slight changes in bandwidth were observed for offset voltages from -250 mV to 250 mV with significant bandwidth loss observed for offset voltages outside this range

Keywords

calibration; oscilloscopes; signal sampling; transfer functions; transient response; waveform analysis; -500 to 500 mV; bandwidth variation; calibration; high-speed samplers; impulse response characterization; kick-out pulses; nose-to-nose sampler; offset voltage effects; pulse amplitude; pulse bandwidth; sampling oscilloscope; transfer function; waveform spectrum; Bandwidth; Connectors; Electric variables measurement; Oscilloscopes; Photoconductivity; Pulse generation; Pulse measurements; Sampling methods; Time domain analysis; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.948291

Filename

948291