DocumentCode :
1526976
Title :
Artificially generated bi-epitaxial YBCO grain boundary junctions on SrTiO/sub 3/ and sapphire substrates
Author :
Nicoletti, S. ; Villegier, J.-C.
Author_Institution :
Istituto LAMEL, CNR, Bologna, Italy
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
1399
Lastpage :
1402
Abstract :
In this work we present the fabrication and characterization of artificially generated bi-epitaxial YBCO grain boundaries on SrTiO/sub 3/ and buffered R-plane sapphire. The grain boundary is obtained by partly interposing a MgO seed layer between a bare or buffered substrate and a CeO/sub 2/ layer. We find that the structural perfection of the YBCO films decrease as the complexity of the stacking sequence increases. By comparing the structural properties of the YBCO film on the different stacking sequences with the transport properties of the fabricated devices, we found a strong correlation between the normalized junction resistance /spl rho//sub N/ and the degree of structural perfection in the superconducting film. The electrical behavior of the obtained junctions can be explained considering the grain boundary as a Josephson structure where the barrier transparency is related with the degree of structural and textural perfection of each superconducting electrode, justifying the correlation between the normalized junction resistance and the disorder in the YBCO films.
Keywords :
Josephson effect; barium compounds; contact resistance; grain boundaries; high-temperature superconductors; interface structure; pulsed laser deposition; sapphire; strontium compounds; superconducting epitaxial layers; vapour phase epitaxial growth; yttrium compounds; Al/sub 2/O/sub 3/; CeO/sub 2/; CeO/sub 2/ layer; Josephson structure; MgO; MgO seed layer; SrTiO/sub 3/; YBCO films; YBa/sub 2/Cu/sub 3/O/sub 7/; artificially generated bi-epitaxial YBCO grain boundaries; artificially generated bi-epitaxial YBCO grain boundary junctions; barrier transparency; buffered R-plane sapphire; buffered substrate; disorder; electrical behavior; fabrication; grain boundary; normalized junction resistance; pulsed laser deposition; sapphire substrates; stacking sequence; structural perfection; structural properties; superconducting film; textural perfection; Character generation; Electric resistance; Electrodes; Fabrication; Grain boundaries; Josephson junctions; Stacking; Substrates; Superconducting films; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.620832
Filename :
620832
Link To Document :
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