Probe correction for near-field scanning with a dielectric fiber

A simple method is presented to characterize the dielectric probe for the near-field beam scanning in mm-wave domain. It is shown that the probe spatial-response can be modeled by Gaussian functions and then directly used in the convolution process to determine the actual measured field. Therefore, the complicated classic deconvolution operation can be replaced by an easy comprehensive analytical process for some usual cases. The measurement results are presented together with a short overview of the probe dynamic-range limits and geometrical concerns to improve the accuracy.