Title :
Characterization and modelling of THz Schottky diodes
Author_Institution :
VTT Tech. Res. Centre of Finland, Espoo, Finland
Abstract :
Efficient characterization and modelling techniques have a key role in the development of Schottky diode-based devices with state-of-the-art performance. This paper makes an effort to introduce such techniques and to provide examples of how they are used by the Schottky community. The modelling techniques covered in the paper are circuit simulator and electro-magnetic modelling. Characterization methods include current-voltage, capacitance-voltage, S-parameter, test jig-based, and thermal measurement techniques.
Keywords :
S-parameters; Schottky diodes; circuit simulation; measurement systems; S-parameter techniques; Schottky community; THz Schottky diodes; capacitance-voltage techniques; characterization techniques; circuit simulator; current-voltage techniques; electromagnetic modelling; modelling techniques; test jig-based techniques; thermal measurement techniques; Electrical resistance measurement; Integrated circuit modeling; Junctions; Mathematical model; Schottky diodes; Thermal resistance;
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location :
Tucson, AZ
DOI :
10.1109/IRMMW-THz.2014.6956306