Title :
Shunt Behavior in RFID UHF Tag According to ISO Standards and Manufacturer Requirements
Author :
Moretto, Alain ; Colin, Elizabeth ; Ripoll, Christian ; Abou Chakra, Sarah
Author_Institution :
LRIT, ESIGETEL, Avon, France
Abstract :
This paper deals with ultra-high-frequency (UHF) radio-frequency identification (RFID) tag modeling. Examples of electrical models and measurements of backscattering by load modulation in RFID systems can be found in scientific literature in far-field conditions. Load modulation and loading effect are based on the same physical phenomenon: the antenna current is modified by switching the load impedance between two impedances which are frequency dependent. All these models neglect the shunt resistance which can deeply affect the load impedance and may produce failures in the communication system.
Keywords :
ISO standards; UHF antennas; backscatter; electric resistance; modulation; radar cross-sections; radiofrequency identification; ISO standard; RFID UHF tag; RFID system; antenna current; backscattering measurement; communication system; electrical model; load impedance; load modulation; loading effect; manufacturer requirement; radar cross section; shunt behavior; shunt resistance; ultra-high-frequency radio-frequency identification tag modeling; Antenna measurements; Backscatter; Electric variables measurement; ISO standards; Impedance; Manufacturing; RFID tags; Radio frequency; Radiofrequency identification; UHF measurements; Backscattering; loading effect; radar cross section;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2010.2053510
