Title :
A 20-b
40-mV Range Read-Out IC With 50-nV Offset and 0.04% Gain Error for Bridge Transducers
Author :
Wu, Rong ; Chae, Youngcheol ; Huijsing, Johan H. ; Makinwa, Kofi A A
Author_Institution :
Analog Devices, Wilmington, MA, USA
Abstract :
This paper presents a 20-b read-out IC with ±40-mV full-scale range that is intended for use with bridge transducers. It consists of a current-feedback instrumentation amplifier (CFIA) followed by a switched-capacitor incremental ΔΣ ADC. The CFIA´s offset and 1/f noise are mitigated by chopping, while its gain accuracy and gain drift are improved by applying dynamic element matching to its input and feedback transconductors. Their mismatch is reduced by a digitally assisted correction loop, which further reduces the CFIA´s gain drift. Finally, bulk-biasing and impedance-balancing techniques are used to reduce the common-mode dependency of these transconductors, which would otherwise limit the achievable gain accuracy. The combination of these techniques enables the read-out IC to achieve 140-dB CMRR, a worst-case gain error of 0.04% over a 0-2.5 V common-mode range, a maximum gain drift of 0.7 ppm/°C and an INL of 5 ppm. After applying nested-chopping, the read-out IC achieves 50-nV offset, 6-nV/°C offset drift, a thermal noise floor of 16.2 nV/√Hz and a 0.1-mHz 1/f noise corner. Implemented in a 0.7-μm CMOS technology, the prototype read-out IC consumes 270 μA from a 5-V supply.
Keywords :
1/f noise; CMOS integrated circuits; electric impedance; error analysis; feedback; instrumentation amplifiers; integrated circuit noise; readout electronics; thermal noise; transducers; 1/f noise; CFIA gain drift; CFIA offset; CMOS technology; CMRR; bridge transducers; common-mode dependency; common-mode range; current 270 muA; current-feedback instrumentation amplifier; digitally assisted correction loop; dynamic element matching; feedback transconductors; frequency 0.1 mHz; full-scale range; gain accuracy; impedance-balancing techniques; nested-chopping; noise corner; prototype read-out IC; size 0.7 mum; switched-capacitor incremental ΔΣ ADC; thermal noise floor; voltage -40 mV to 40 mV; voltage 0 V to 2.5 V; voltage 5 V; voltage 50 nV; worst-case gain error; Accuracy; Bridge circuits; Calibration; Choppers; Integrated circuits; Noise; Transducers; $1/ f $ noise; bridge transducer; chopping; current-feedback instrumentation amplifier (CFIA); dynamic element matching; gain accuracy; gain drift; incremental delta-sigma ADC; linearity; offset; readout-IC;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2012.2197929