DocumentCode :
1537420
Title :
Nonlinear resistive electric field control for power electronic modules
Author :
Donzel, L. ; Schuderer, J.
Author_Institution :
ABB Corp. Res., Dattwil, Switzerland
Volume :
19
Issue :
3
fYear :
2012
fDate :
6/1/2012 12:00:00 AM
Firstpage :
955
Lastpage :
959
Abstract :
The trend towards increasing blocking voltage of high power Insulated Gate Bipolar Transistor (IGBT) modules is challenging for their electric insulation system. In particular, the electric field at the edges of the substrate metallization increases accordingly and can exceed the dielectric strength of the gel commonly used as encapsulation, leading to partial discharges or even breakdown of the insulation. This paper reports on the use of nonlinear resistive field grading to mitigate the electric field within power electronic modules. Finite element simulations show how the field enhancements can be significantly reduced by applying a functional coating with suitable nonlinear resistive characteristic. Coatings made of polyimide filled with ZnO microvaristors were manufactured and tested.
Keywords :
II-VI semiconductors; electric strength; electric variables control; encapsulation; finite element analysis; insulated gate bipolar transistors; nonlinear control systems; partial discharges; power electronics; zinc compounds; ZnO; dielectric strength; electric insulation system; encapsulation; finite element simulations; high power insulated gate bipolar transistor modules; microvaristors; nonlinear resistive electric field control; nonlinear resistive field grading; partial discharges; polyimide; power electronic modules; substrate metallization; Coatings; Electric fields; Metallization; Partial discharges; Polyimides; Substrates; Insulation; dielectric breakdown; electric field effects; finite element methods; insulated gate bipolar transistor module; nonlinear media; power electronics;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2012.6215099
Filename :
6215099
Link To Document :
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