DocumentCode
15376
Title
Performance Assessment of III–V Channel Ultra-Thin-Body Schottky-Barrier MOSFETs
Author
Jaehyun Lee ; Mincheol Shin
Author_Institution
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume
35
Issue
7
fYear
2014
fDate
Jul-14
Firstpage
726
Lastpage
728
Abstract
The performance of III-V channel ultra-thin-body Schottky barrier (SB) MOSFETs is assessed by quantum mechanical simulations. All the Γ-, L-, and Δ-valleys are included in the calculations, with their effective masses adjusted by the sp3d5s* tight-binding method. Our results show that InSb and InAs channel devices are not adequate for SB devices due to high ambipolar currents. InSb, InAs, and GaAs channel devices suffer from the serious density-of-states (DOS) bottleneck problem. Their transconductances are only about 1/4 of that of Si channel devices. On the other hand, GaSb channel devices which are immune from the DOS bottleneck show excellent performance. The transconductance and ON-state current that are, respectively, 1.2 and 1.8 times as large as that of Si-based devices can be achievable.
Keywords
III-V semiconductors; MOSFET; Schottky barriers; electronic density of states; gallium arsenide; indium compounds; Γ-valley; Δ-valley; DOS bottleneck problem; GaAs; GaSb; III-V channel ultrathin-body SB MOSFET; III-V channel ultrathin-body Schottky-barrier MOSFET; InAs; InSb; L-valley; ON-state current; ambipolar current; channel devices; density-of-state bottleneck problem; quantum mechanical simulation; sp3d5s* tight-binding method; transconductances; Effective mass; Gallium arsenide; MOSFET; Performance evaluation; Silicon; DOS bottleneck; DOS bottleneck.; III-V; III??V; MOSFET; Schottky barrier; germanium; non-equilibrium Green´s function; ultra-thin-body;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2014.2322370
Filename
6819401
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