DocumentCode
15412
Title
All-Electrical Thermal Monitoring of Terahertz Quantum Cascade Lasers
Author
Krall, M. ; Bachmann, D. ; Deutsch, C. ; Brandstetter, M. ; Detz, H. ; Andrews, A.M. ; Schrenk, W. ; Strasser, G. ; Unterrainer, K.
Author_Institution
Photonics Inst. & the Center for Micro- & Nanostruct., Vienna Univ. of Technol., Vienna, Austria
Volume
26
Issue
14
fYear
2014
fDate
July15, 15 2014
Firstpage
1470
Lastpage
1473
Abstract
A key limitation, especially for the continuous-wave operation of terahertz quantum cascade lasers, is the large amount of heat dissipated in the active region. We demonstrate an all-electrical technique for monitoring the lattice temperature and characterizing the thermal properties of the active region, using the waveguide of the device as a temperature sensor. We report a measured temperature difference between the heat sink and top waveguide layer of up to 27 K during the continuous-wave operation of GaAs/Al0.15Ga0.85As-based devices, lasing at 2.4 THz. A thermal model of the devices is used to determine the thermal conductivity of the active region perpendicular to the semiconductor interfaces to be 7.3 W/(m·K).
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; laser variables measurement; microwave photonics; quantum cascade lasers; temperature measurement; temperature sensors; terahertz wave devices; thermal conductivity; waveguide lasers; GaAs-Al0.15Ga0.85As; active region; all-electrical technique; all-electrical thermal monitoring; continuous-wave operation; frequency 2.4 THz; heat dissipation; heat sink; lattice temperature; semiconductor interfaces; temperature difference measurement; temperature sensor; terahertz quantum cascade lasers; thermal conductivity; thermal model; thermal properties; top waveguide layer; Conductivity; Current measurement; Electrical resistance measurement; Heat sinks; Quantum cascade lasers; Resistance; Temperature measurement; Semiconductor superlattice; quantum cascade lasers; temperature measurement; terahertz; thermal resistance;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2014.2326043
Filename
6819404
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