DocumentCode :
1541760
Title :
Thermal Noise in Track-and-Hold Circuits: Analysis and Simulation Techniques
Author :
Murmann, Boris
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Volume :
4
Issue :
2
fYear :
2012
Firstpage :
46
Lastpage :
54
Abstract :
As a vehicle that lets us explore the main ideas of this article, we will utilize the commonly used charge-redistribution track-and-hold amplifier (THA) circuit (shown in Figure 1) and evaluate this circuit in terms of its thermal noise performance. Of course, it is well know that the thermal noise of this circuit is somehow related to “kT/C.” What we accomplish in this article is to precisely track down the proper proportionally constants so that we can validate the results of a circuit simulation with good precision. After all, as you have learned from your experienced analog guru, you will never trust a circuit simulation blindly, right?
Keywords :
CMOS analogue integrated circuits; amplifiers; circuit simulation; sample and hold circuits; thermal noise; CMOS circuit; THA circuit; charge-redistribution track-and-hold amplifier; circuit simulation techniques; thermal noise performance; track-and-hold circuits; Circuit simulation; Noise measurement; Thermal noise; Tutorials;
fLanguage :
English
Journal_Title :
Solid-State Circuits Magazine, IEEE
Publisher :
ieee
ISSN :
1943-0582
Type :
jour
DOI :
10.1109/MSSC.2012.2192190
Filename :
6218338
Link To Document :
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