Title :
Sensitivity analysis of structure in GMR/insulator/SAL sensor
Author :
Negoro, Yoichi ; Okabe, Akihiko ; Kano, Hiroshi ; Kagawa, Kiyoshi ; Suzuki, Atsuko ; Yaoi, Toshihiko ; Hayashi, Kazuhiko
Author_Institution :
Res. Center, Sony Corp., Yokohama, Japan
fDate :
3/1/1997 12:00:00 AM
Abstract :
A guideline for the optimum design of the soft adjacent layer (SAL)-biased giant magnetoresistive (GMR) sensors, which are a promising MR head for use at high areal densities, with electromagnetic field computation based on a 2D finite element method is reported. The bias level is highly sensitive to the element height, and it is desirable that element height should be less than 1 μm for the shielded sensor
Keywords :
design engineering; electromagnetic fields; finite element analysis; giant magnetoresistance; magnetic sensors; magnetoresistive devices; optimisation; sensitivity analysis; 2D finite element method; bias level; electromagnetic field computation; element height; giant magnetoresistive sensors; optimum design guidelines; shielded sensor; soft adjacent layer biasing; Electromagnetic fields; Giant magnetoresistance; Insulation; Magnetic films; Magnetic heads; Magnetic materials; Magnetic multilayers; Magnetic sensors; Sensitivity analysis; Sensor phenomena and characterization;
Journal_Title :
Magnetics, IEEE Transactions on
