• DocumentCode
    1542399
  • Title

    Development of gamma-ray monitor using CdZnTe semiconductor detector

  • Author

    Rasolonjatovo, D.A.H. ; Shiomi, T. ; Nakamura, T. ; Nishizawa, H. ; Tsudaka, Y. ; Fujiwara, H. ; Araki, H. ; Matsuo, K.

  • Author_Institution
    Dept. of Quantum Sci. & Energy Eng., Tohoku Univ., Sendai, Japan
  • Volume
    48
  • Issue
    4
  • fYear
    2001
  • fDate
    8/1/2001 12:00:00 AM
  • Firstpage
    1570
  • Lastpage
    1576
  • Abstract
    In this study, we aimed to develop a new X-ray and gamma-ray monitor using the CdZnTe semiconductor detector, which has high sensitivity at room temperature. The pulse height spectra and the detection efficiencies of 10 mm×10 mm by 2 mm thick CdZnTe detector were measured in the energy range of 10 keV to 1.8 MeV by using monoenergetic X-ray and gamma-ray sources. The measured results showed very good agreement with the results calculated using the EGS4 Monte Carlo code taking into account the charge collection efficiency in the detector. By using two CZT detectors of 10 mm×10 mm×2 mm and 3 mm ×3 mm×2 mm coupled with a filter, the weighted sum of a few energy channels with different cutoff energies was finally found to realize a flat energy response with an equivalent dose (counts per μSv) within ±30% or ±10% deviation
  • Keywords
    II-VI semiconductors; Monte Carlo methods; X-ray detection; cadmium compounds; gamma-ray detection; semiconductor counters; wide band gap semiconductors; CZT detectors; CdZnTe; CdZnTe semiconductor detector; EGS4 Monte Carlo code; charge collection efficiency; detection efficiencies; equivalent dose; flat energy response; gamma-ray monitor; monoenergetic X-ray sources; monoenergetic gamma-ray sources; pulse height spectra; Current measurement; Energy measurement; Gamma ray detection; Gamma ray detectors; Monitoring; Pulse measurements; Temperature sensors; Thickness measurement; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.958398
  • Filename
    958398