DocumentCode :
1542432
Title :
A 250 k-pixel SIT image sensor operating in its high-sensitivity mode
Author :
Mizoguchi, Toyokazu ; Takayanagi, Isao ; Shimizu, Etsuro ; Nakajima, Hidetaka ; Hashimoto, Sakae ; Yokoyama, Satoshi ; Nakamura, Jun-ichi ; Imai, Masaharu
Author_Institution :
Olympus Opt. Co. Ltd., Nagano, Japan
Volume :
38
Issue :
5
fYear :
1991
fDate :
5/1/1991 12:00:00 AM
Firstpage :
1021
Lastpage :
1027
Abstract :
A solid-state imaging device which uses a static induction transistor (SIT) is examined. The image sensor consists of 530(H)×490(V) pixels and is suitable for a 2/3-in optical format. An analysis of its operation predicts that the performance of the image sensor can be examined in detail using an equivalent circuit. A noise equivalent irradiance of 1.5×10-4 μW/cm2, when using light-emitting diodes (λ=660 nm) as a light source, was obtained in a frame integration mode. This is comparable to that of a high-sensitivity silicon intensifier target tube, although a large image lag of 80% during the third frame is also present. High sensitivity, is achieved because the gate reset levels of the SIT depend on the exposure and the change of the gate reset levels added to the output signal. It is predicted that the image sensor will be highly sensitive but that it will have a large image lag
Keywords :
field effect transistors; image sensors; 0.666 in; 2/3-in optical format; 259700 pixel; 490 pixel; 530 pixel; SIT image sensor; equivalent circuit; frame integration mode; high-sensitivity; image lag; noise equivalent irradiance; operation; performance; static induction transistor; Circuit noise; Equivalent circuits; Image analysis; Image sensors; Optical imaging; Optical noise; Optical sensors; Performance analysis; Pixel; Solid state circuits;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.78374
Filename :
78374
Link To Document :
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