Fabrication and properties of Nd-Ba-Cu-O/Pr-Ba-Cu-O/Nd-Ba-Cu-O ramp-edge junctions

Author

Alvarez, G.A. ; Becht, M. ; Utagawa, T. ; Toma, K. ; Kawabe, U. ; Wang, F. ; Li, Y. ; Saba, F. ; Sato, M. ; Tanabe, K.

Author_Institution

Supercond. Res. Lab., ISTEC, Tokyo, Japan

Volume

9

Issue

2

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

3370

Lastpage

3373

Abstract

We present recent results on the fabrication process of NdBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (NBCO) ramp-edge junctions with a PrBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (PBCO) barrier by pulsed laser deposition (PLD). We also describe the fabrication of high T/sub c/ Superconductor-Normal metal Superconductor (SNS) junctions in an edge geometry with integrated ground planes and insulators. The process incorporates five layers which includes an integrated high T/sub c/ ground plane with a low /spl epsiv//sub r/ interlevel dielectric layer of CeO/sub 2/ deposited by Metal Organic Chemical Vapour Deposition (MOCVD). We have used YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) single crystals as a groundplane. It was confirmed that NBCO layers could be incorporated in the multilayer structure without substantial degradation. Process modifications necessary to reach our fabrication goals are outlined.

Keywords

Josephson effect; barium compounds; high-temperature superconductors; neodymium compounds; praseodymium compounds; pulsed laser deposition; superconductor-normal-superconductor devices; CeO/sub 2/; NBCO/PBCO/NBCO ramp-edge Josephson junction; NdBaCuO-PrBaCuO-NdBaCuO; SNS junction; YBCO groundplane; fabrication; high T/sub c/ superconductor; interlevel dielectric layer; metalorganic chemical vapour deposition; multilayer; pulsed laser deposition; Dielectrics and electrical insulation; Geometrical optics; Josephson junctions; Metal-insulator structures; Optical device fabrication; Optical pulses; Organic chemicals; Pulsed laser deposition; Superconducting devices; Superconducting epitaxial layers;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.783752

Filename

783752