DocumentCode :
1542583
Title :
A low-inductance, low-I/sub c/ HTS junction process
Author :
Murduck, J.M. ; Burch, J. ; Hu, R. ; Pettiette-Hall, C. ; Luine, J.A. ; Schwarzbek, S.M. ; Sergant, M. ; Chan, H.
Author_Institution :
TRW Space & Electron. Group, Redondo Beach, CA, USA
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
2940
Lastpage :
2943
Abstract :
One of the challenges In fabricating digital circuitry with high temperature superconductors (HTS) is in developing a reliable junction process. The requirements of this junction process include: low-parasitic inductance, well-targeted and reproducible total inductance, uniformity in I/sub c/ and R/sub n/, and also well-targeted I/sub c/ and I/sub c/R/sub n/ product greater than 300 /spl mu/V at 65 K. Junction inductance can be greatly reduced by fabrication above a groundplane. Yet the addition of a groundplane introduces fabrication issues such as film smoothness and maintenance of epitaxy through the multiple layers necessary. Step-edge junctions and SNS edge junctions with groundplanes are examined and compared through a Taguchi experimental design series. Process equipment modifications in our HTS foundry necessary to reach our fabrication goals are outlined.
Keywords :
Josephson effect; critical currents; high-temperature superconductors; inductance; HTS junction fabrication; SNS edge junction; Taguchi experimental design; critical current; digital circuit; epitaxy; fabrication; foundry; groundplane; high temperature superconductor; inductance; normal resistance; parasitic inductance; step-edge junction; Critical current; Dielectrics; Digital circuits; Fabrication; High temperature superconductors; Inductance; Logic arrays; Resistors; Silicon; Silver;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.621923
Filename :
621923
Link To Document :
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